Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE

作者：He, Wei; He, Yigang^*; Li, Bing; Zhang, Chaolong

来源：Entropy, 2018, 20(8): 604.

DOI：10.3390/e20080604

• analog circuit
• fault diagnosis
• cross wavelet transform
• Tsallis entropy
• parametric t-distributed stochastic neighbor embedding
• support vector machine

In this paper, a novel method with cross-wavelet singular entropy (XWSE)-based feature extractor and support vector machine (SVM) is proposed for analog circuit fault diagnosis. Primarily, cross-wavelet transform (XWT), which possesses a good capability to restrain the environment noise, is applied to transform the fault signal into time-frequency spectra (TFS). Then, a simple segmentation method is utilized to decompose the TFS into several blocks. We employ the singular value decomposition (SVD) to analysis the blocks, then Tsallis entropy of each block is obtained to construct the original features. Subsequently, the features are imported into parametric t-distributed stochastic neighbor embedding (t-SNE) for dimension reduction to yield the discriminative and concise fault characteristics. Finally, the fault characteristics are entered into SVM classifier to locate circuits' defects that the free parameters of SVM are determined by quantum-behaved particle swarm optimization (QPSO). Simulation results show the proposed approach is with superior diagnostic performance than other existing methods.

• 出版日期2018-8
• 单位安庆师范大学; 合肥工业大学; 武汉大学