An offset distribution modification technique of stochastic flash ADC

作者：Asano Tomohiro; Hirai Yusaku; Tani Sadahiro; Yano Shinya; Jo Ikkyun; Matsuoka Toshimasa^*

来源：IEICE Electronics Express, 2016, 13(6): 20160115.

DOI：10.1587/elex.13.20160115

• stochastic flash ADC
• comparator
• mismatch
• CMOS
• genetic algorithm

A new non-linearity reduction technique for stochastic flash ADC (SF-ADC) is proposed, focusing on distribution of comparator input-referred offsets. The SF-ADC test chip fabricated in a 130-nm CMOS process demonstrated the proposed technique can improve SNDR. In addition, the digital re-quantization also can improve the linearity more, where quantization level and fractional correction can be optimized using genetic algorithm.

• 出版日期2016-3-25