Sparsification of Dense Capacitive Coupling of Interconnect Models

作者:Miettinen Pekka*; Honkala Mikko; Roos Janne; Valtonen Martti
来源:IEEE Transactions on Very Large Scale Integration Systems, 2013, 21(10): 1955-1959.
DOI:10.1109/TVLSI.2012.2227284

摘要

Parasitic elements play a major role in advanced circuit design and pose considerable run-time and memory problems for the post-layout verification, especially in the case of full-chip extraction. This brief presents a realizable R(L) C(M)-netlist-in-R(L) C(M)-netlist-out method to sparsify and reduce the capacitive coupling parasitics in circuits with interconnect lines. The method is applicable in conjunction with partitioning-based model-order reduction algorithms to reduce the complete extracted netlists, or as a stand-alone tool to process only the capacitive coupling. It is shown that, by using the method, circuits with even dense capacitive coupling can be partitioned and reduced efficiently.

  • 出版日期2013-10