科研之友
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摘要
Lattice orientation detection techniques are crucial for two-dimensional materials as many unusual properties, such as electronic, optical, catalytic and magnetic properties, are closely related to particular lattice orientations. Herein, we propose a novel, low-cost and convenient detection technique, referred to as a single-line-scan power spectrumanalysis (SPSA), which is established based on the power spectrumanalysis of friction information that is extracted from an atomic-resolution lateral friction microscopy image. By analysing the characteristics of the friction information and the corresponding frequency spectrum obtained from the tribological surface of MoS2, we innovatively establish a relationship between the frequency characteristics and lattice orientation and ultimately propose our SPSA, which enables detection of the direct lattice orientation using the frequency characteristic values of an arbitrary line on an atomic image. The experimental results further verify the effectiveness and convenience of the SPSA process.
- 出版日期2017-12-5
- 单位中国科学院; 中国科学院沈阳自动化研究所; 机器人学国家重点实验室; 中国科学院大学; 长春师范大学; 香港中文大学
