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摘要
This paper presents a novel data compression method for testing integrated circuits within the framework of pattern run-length coding. The test set is firstly divided into 2(n)-length patterns where n is a natural number. Then the compatibility of each pattern, which can be an external type, or an internal type, is analyzed. At last, the codeword of each pattern is generated according to its analysis result. Experimental results for large ISCAS89 benchmarks show that the proposed method can obtain a higher compression ratio than existing ones.
- 出版日期2013-9
- 单位中国科学院声学研究所
