作者:Sadhu Bodhisatwa*; Ferriss Mark A; Natarajan Arun S; Yaldiz Soner; Plouchart Jean Olivier; Rylyakov Alexander V; Valdes Garcia Alberto; Parker Benjamin D; Babakhani Aydin; Reynolds Scott; Li Xin; Pileggi Larry; Harjani Ramesh; Tierno Jose A; Friedman Daniel
来源:IEEE Journal of Solid-State Circuits, 2013, 48(6): 1539-1539.
DOI:10.1109/JSSC.2013.2263875