Annealing on the electrical properties of Ni0.75Mn2.25O4 and Zn0.8Ni0.75Mn1.45O4 NTC ceramics

作者：Zhao, Chunhua^*; Zhao, Yongli; Wang, Yiqun

来源：Solid State Communications, 2012, 152(7): 593-595.

DOI：10.1016/j.ssc.2012.01.019

• Ceramics
• Electrical property
• X-ray diffraction
• Thermogravimetric analyses

Annealing temperatures on aging of Ni0.75Mn2.25O4 and Zn0.8Ni0.75Mn1.45O4 NTC ceramics were investigated. Zn doping can effectively improve the electrical stability of Ni0.75Mn2.25O4. The aging values for Ni0.75Mn2.25O4 stay almost constant below 300 degrees C, and then increase sharply from 4.7% to 32% with increasing annealing temperature from 400 to 850 degrees C. For Zn0.8Ni0.75Mn1.45O4, the aging values are below 10% for all annealing temperatures, 150 to 850 degrees C. The aging phenomenon is caused by the oxygen uptake/release and the redistribution of cations/vacancies.

• 出版日期2012-4
• 单位上海工程技术大学; 华东理工大学