科研之友
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摘要
To measure the bunch shape of an ion beam accelerated by an rf linear accelerator, we have designed and constructed a detector system measuring secondary electrons emitted when the beam hits a thin wire placed in the beam path. The device consists of a vacuum chamber, a target wire, an rf resonator to deflect the electrons in correlation with the rf time of the ion beam, and multi-channel plate (MCP) detector to measure the electron current. The overall design of this device was carried out based on electron optical calculations. A full-scale model of the rf deflector was used to prove its design, and the MCP detector was tested using a beta-emitting source to check its performance. An actual rf deflector was constructed and tested at a low rf power. The time resolution of the system was estimated to be around 30 ps.
- 出版日期2011-2
