摘要
Phase retrieval is widely used in phase contrast microscopy. Here we present an autofocus algorithm that allows the phase of the exit wave function, from a single-material object, to be reconstructed at medium resolution from a single phase contrast image without any a priori knowledge of the imaging system or object. The algorithm is demonstrated on coherent out-of-focus electron micrographs of 30nm latex sphere calibration standards, giving <10% RMS error over a large defocus range.
- 出版日期2011-5-15