A Miniaturized Biaxial Deformation Rig for in Situ Mechanical Testing

作者：Van Petegem S; Guitton A; Dupraz M; Bollhalder A; Sofinowski K; Upadhyay M V; Van Swygenhoven H^*

来源：Experimental Mechanics, 2017, 57(4): 569-580.

DOI：10.1007/s11340-016-0244-0

• Biaxial deformation
• Strain path changes
• In situ X-ray diffraction
• Scanning electron microscope

A novel miniaturized biaxial deformation rig is presented. It allows one to apply in-plane biaxial stress states with arbitrary stress ratios and to perform strain path changes on thin-sheet metals. The device is optimized for in situ usage inside a scanning electron microscope and at synchrotron beam lines. The sample has a cruciform shape and the geometry is optimized with the aid of finite element simulations. A proof-of-principle experiment confirms the successful operation of this rig.

• 出版日期2017-4