Nanoscale quantitative phase imaging using XOR-based X-ray differential interference contrast microscopy

作者：Nakamura Takashi; Chang Chang^*

来源：Ultramicroscopy, 2012, 113: 139-144.

DOI：10.1016/j.ultramic.2011.10.012

• X-ray microscopy
• Differential interference contrast
• Diffractive optics
• XOR pattern
• Quantitative phase imaging

We propose a quantitative x-ray phase imaging technique using previously demonstrated XOR objectives. The fabrication process of XOR is identical to that of a Fresnel zone-plate and as a result the same finest outermost zone width, thus spatial resolution, can be achieved. A series of phase shifts from 0 to 2 pi is implemented by shifting the relative position of the grating with respect to the zone-plate. Both qualitative differential interference contrast imaging and quantitative phase reconstruction are demonstrated. We expect this high-resolution quantitative x-ray phase imaging capability to further enhance the utility of existing x-ray microscopy facilities.

• 出版日期2012-2