Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Coupled Interconnect Lines

作者：Lee Minji^*; Kim Dongchul; Eo Yungseon

来源：Journal of Semiconductor Technology and Science, 2013, 13(6): 594-607.

DOI：10.5573/JSTS.2013.13.6.594

• Eye-diagram
• jitter
• transmission line
• inter-symbol interference (ISI)
• signal integrity

A new efficient analytical eye-diagram determination technique for coupled interconnect lines is presented. Two coupled lines are decoupled into isolated eigen modes; bit blocks for coupled lines, which are defined as a block of consecutive bits, are then represented with decoupled modes. The crosstalk effects within the bit blocks are taken into account. Thereby, the crucial input bit patterns for the worst case eye-diagram determination are modeled mathematically, including inter-symbol interference (ISI). The proposed technique shows excellent agreement with the SPICE-based simulation. Furthermore, it is very computation-time-efficient in the order of magnitude, compared with the SPICE simulation, which requires numerous pseudo-random bit sequence (PRBS) input signals.

• 出版日期2013-12