Dynamic Test Methods for COTS SRAMs

作者：Tsiligiannis G^*; Dilillo L; Gupta V; Bosio A; Girard P; Virazel A; Puchner H; Bosser A; Javanainen A; Virtanen A; Frost C; Wrobel F; Dusseau L; Saigne F

来源：IEEE Transactions on Nuclear Science, 2014, 61(6): 3095-3102.

DOI：10.1109/TNS.2014.2363123

• 65 nm
• 90 nm
• COTS
• dynamic test
• heavy ions
• multiple cell upset (MCU)
• neutrons
• single event upset (SEU)
• SRAMs

In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmospheric-like neutron irradiation of two COTS SRAMs of 90 nm and 65 nm technology.

• 出版日期2014-12