Apertureless scanning microscope probe as a detector of semiconductor laser emission

作者：Dunaevskiy Mikhail^*; Dontsov Anton; Alekseev Prokhor; Monakhov Andrei; Baranov Alexei; Girard Paul; Arinero Richard; Teissier Roland; Titkov Alexander

来源：Applied Physics Letters, 2015, 106(17): 171105.

DOI：10.1063/1.4919528

An operating semiconductor laser has been studied using a scanning probe microscope. A shift of the resonance frequency of probe that is due to its heating by laser radiation has been analyzed. The observed shift is proportional to the absorbed radiation and can be used to measure the laser near field or its output power. A periodical dependence of the measured signal has been observed as a function of distance between the probe and the surface of the laser due to the interference of the outgoing and cantilever-reflected waves. Due to the multiple reflections resulting in the interference, the light absorption by the probe cantilever is greatly enhanced compared with a single pass case. Interaction of infrared emission of a diode laser with different probes has been studied.

• 出版日期2015-4-27