Note: Advancement in tip etching for preparation of tunable size scanning tunneling microscopy tips

作者:Corbett J P; Pandya S G; Mandru A O; Pak J; Kordesch M E; Smith A R*
来源:Review of Scientific Instruments, 2015, 86(2): 026104.
DOI:10.1063/1.4907706

摘要

The two aspects of a scanning tunneling microscopy tip, the macroscopic profile and the nanoscale apex, can be tailored by controlling the tension during electrochemical etching and the solution-electrode contact area via acetone vapor. The apex diameter is shown to be proportional to the square root of the tension, and is demonstrated over apex diameters of 150-500 nm. The apex was found to be created in four distinct shapes where a secondary etching can reshape the tip into a single geometry. Improvement in tip height and stability of the profile are demonstrated versus a non-acetone fabrication control.

  • 出版日期2015-2