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摘要
This paper shows the work for the automation and control of a scanning tunneling microscope (STM) built by the authors. The interface between the computer and the microscope has been implemented by mean of the data acquisition board OMB-DaqBoard/2000. A developed software in LabVIEW generates the signals required for the X-Y scanning, and it simultaneously acquires the Z voltages, related to the tunneling current between the tip and the sample. The program constructs the microscopy images of the studied surface from the Z voltages. The process to calibrate the instrument using atomic resolution images of known samples is also presented.
- 出版日期2016-2
