A novel and compact nanoindentation device for in situ nanoindentation tests inside the scanning electron microscope

作者:Huang Hu; Zhao Hongwei*; Mi Jie; Yang Jie; Wan Shunguang; Xu Lixia; Ma Zhichao
来源:AIP Advances, 2012, 2(1): 012104.
DOI:10.1063/1.3676691

摘要

In situ nanomechanical tests provide a unique insight into mechanical behaviors of materials, such as fracture onset and crack propagation, shear band formation and so on. This paper presents a novel in situ nanoindentation device with dimensions of 103mmx74mmx60mm. Integrating the stepper motor, the piezoelectric actuator and the flexure hinge, the device can realize coarse adjustment of the specimen and precision loading and unloading of the indenter automatically. A novel indenter holder was designed to guarantee that the indenter penetrates into and withdraws from the specimen surface vertically. Closed-loop control of the indentation process was established to solve the problem of nonlinearity of the piezoelectric actuator and to enrich the loading modes. The in situ indentation test of Indium Phosphide (InP) inside the scanning electron microscope (SEM) was carried out and the experimental result indicates the feasibility of the developed device.

全文