Architecture of a Reusable BIST Engine for Detection and Autocorrection of Memory Failures and for IO Debug, Validation, Link Training, and Power Optimization on 14-nm SoC

作者:Querbach Bruce*; Khanna Rahul; Puligundla Sudeep; Blankenbeckler David; Crop Joseph; Chiang Patrick Yin
来源:IEEE Design & Test, 2016, 33(1): 60-68.
DOI:10.1109/MDAT.2015.2445053