An effective method to reduce test power dissipation

作者：Yu Yang^*; Peng Xiyuan

来源：7th International Symposium on Test Measurement, 2007-08-05 to 2007-08-08.

• scan cell reorder
• test vector reorder
• test power

In order to reduce test power for scan operation, a scan cell and test vector reordering algorithm and corresponding hardware architecture is proposed in this paper Experiments on ISCAS89 benchmark show that the proposed method is rather effective in reducing test power and the hardware overhead is reasonable acceptable.

• 出版日期2007
• 单位哈尔滨工业大学