A method for characterizing mechanical properties of sugar films using a piezoelectric-excited millimeter sized cantilever (PEMC) sensor

作者：Lakshmanan Ramji S; Mutharasan Raj^*

来源：Sensors and Actuators B: Chemical , 2011, 160(1): 1304-1308.

DOI：10.1016/j.snb.2011.09.066

• Resonant frequency
• Film mechanical property
• Spring constant increase

Resonant-mode cantilevers have been investigated widely for detection of target analyte mass. We examine its application for measuring mechanical property of an organic film. A cantilever resonant frequency depends both on its mass and its spring constant. A change in either one of them causes resonant frequency shifts. Piezoelectric excited millimeter sized cantilever (PEMC) sensors exhibit high mass-change sensitivity (2 fg/Hz) at high-order resonant modes present in the frequency range of 800-1000 kHz. The response of this high-order mode to the formation of a sugar film membrane provides experimental data for characterizing the mechanical properties of the sugar film. Sugar film formation, surprisingly, caused a significant resonant frequency increase of greater than 20 kHz. The high-order mode was highly sensitive to spring constant changes caused by the sugar film and was characterized by varying thickness and temperature of the sugar films.

• 出版日期2011-12-15