Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

作者：Wu Yanfei; Ren Xinglong; McGarry Kathryn A; Bruzek Matthew J; Douglas Christopher J; Fri**ie C Daniel^*

来源：Advanced Electronic Materials, 2017, 3(7): 1700117.

DOI：10.1002/aelm.201700117

• chemical etching
• organic single crystals
• planar defects
• scanning Kelvin probe microscopy
• surface potential

Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure-transport relationships in organic semiconductor single crystals.

• 出版日期2017-7