Nano/micro-mechanical and tribological characterization of Ar, C, N, and Ne ion-implanted Si

作者:Xu Zhi Hui; Park Young Bae; Li Xiaodong*
来源:Journal of Materials Research, 2010, 25(5): 880-889.
DOI:10.1557/JMR.2010.0117

摘要

Ion implantation has been widely used to improve the mechanical and tribological properties of single crystalline silicon, an essential material for the semiconductor industry. In this study. the effects of four different ion implantations, Ar, C, N, and Ne ions, on the mechanical and tribological properties of single crystal Si were investigated at both the nanoscale and the microscale. Nanoindentation and microindentation were used to measure the mechanical properties and fracture toughness of ion-implanted Si. Nano and micro scratch and wear tests were performed to study the tribological behaviors of different ion-implanted Si The relationship between the mechanical properties and tribological behavior and the damage mechanism of scratch and wear were also discussed.

  • 出版日期2010-5