A new method to evaluate sensitivity of sensitive load to voltage sag

作者：Ouyang, Sen^*; Shi, Yi-Li; Pan, Wei; Feng, Tian-Rui

来源：Journal of South China University of Technology(Natural Science Edition), 2013, 41(8): 9-14.

DOI：10.3969/j.issn.1000-565X.2013.08.002

• Load sensitivities
• Sensitive loads
• Sensitivity evaluation
• Uncertainty regions
• Variance method
• Voltage sags
• Voltage tolerance curve
• Weighted Sum

Proposed in this paper is a new method to evaluate the voltage sag sensitivity (VSS) of the sensitive load by combining several probability density function models, which can fully describe the randomness of the load sensitivity. First, five typical probability density functions are deeply analyzed and are used to respectively establish the mathematical model of the voltage tolerance curve of the sensitive load, and the VSS of the sensitive load in the uncertainty region is evaluated respectively by the five models. Then, the weighted sum of the results of the five models is calculated by means of the unbiased variance method. Finally, the rationality and effectiveness of the proposed method are verified by simulation results.

• 出版日期2013-8
• 单位华南理工大学