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摘要
Several partial measurements need to be captured for a complete deflectometric inspection with uniform precision of large and complexly shaped surfaces. The manual choice of the sensor configurations is a time consuming and non-trivial task. In this article we suggest a probabilistic planning procedure which, with a given reference surface, plans a sequence of sensor configurations. Therefore it can minimize the uncertainty on the surface estimated. In a simulation we empirically evaluate various covariance-based measures and discuss their suitability for the deflectometric inspection task.
- 出版日期2013
