A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures

作者:Ganesan K; Ghosh Subrata; Krishna Nanda Gopala; Ilango S; Kamruddin M; Tyagi A K
来源:Physical Chemistry Chemical Physics, 2016, 18(32): 22160-22167.
DOI:10.1039/c6cp02033j

摘要

Defects in planar and vertically oriented nanographitic structures (NGSs) synthesized by plasma enhanced chemical vapor deposition (PECVD) have been investigated using Raman and X-ray photoelectron spectroscopy.

  • 出版日期2016-8-28

全文