Scatter: software for the analysis of nano- and mesoscale small-angle scattering

作者:Foerster S*; Apostol L; Bras W
来源:JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2010, 43(3): 639-646.
DOI:10.1107/S0021889810008289

摘要

Scatter is a new software for analysis, modeling and fitting of one- and two-dimensional small-angle scattering data of non-ordered, partially ordered or fully ordered nano- and mesoscale structures. The calculations are based on closed analytical expressions for the scattering intensity, enabling efficient evaluation of form factors and structure factors. The software allows one to sequentially fit large series of scattering curves and scattering patterns automatically. It provides further tools for data loading, beam centering, calibration, zooming, binning, lattice identification, calculation of density profiles and size distributions, and visualization of real-space structures. Presentations of experimental and calculated data can be saved as is for presentations or exported for further graphical or mathematical treatment.

  • 出版日期2010-6