An inspection algorithm for surface mounted transistor components based on edge and color feature

作者：Wu, Huihui; Zhang, Xianmin^*; Hong, Shiliang

来源：Chinese Journal of Scientific Instrument, 2009, 30(5): 1020-1025.

• Automatic optical inspection
• Color features
• Color segmentation
• Edge lines
• Filtering algorithm
• Inspection algorithms
• Structure light
• Surface-mounted

To inspect the quality of the mounted transistor components, an algorithm based on edge and color feature was presented. Firstly, the model of the transistor component under three colors (red, greed, and blue) structure light source was set up and the feature was analyzed. Secondly, the edges of image were extracted and the edges of potential electrodes were connected after filtering disturbing edge lines with the linear and rectangle filtering algorithm, then, the electrodes were precisely located through color segmentation in HSI space and the electrodes were analyzed to classify the type of component correctly. Finally, the component body was inspected through the match algorithm based on the projection. The experiment results showed that the proposed method could effectively identify the defects of the transistor component, such as missing component, shift, skew, wrong components etc.

• 出版日期2009-5
• 单位华南理工大学