Amorphous carbon contamination monitoring and process optimization for single-walled carbon nanotube integration

作者:Jungen A*; Stampfer C; Durrer L; Helbling T; Hierold C
来源:Nanotechnology, 2007, 18(7): 075603.
DOI:10.1088/0957-4484/18/7/075603

摘要

We detail the monitoring of amorphous carbon deposition during thermal chemical vapour deposition of carbon nanotubes and propose a contamination-less process to integrate high-quality single-walled carbon nanotubes into micro-electromechanical systems. The amorphous content is evaluated by confocal micro-Raman spectroscopy and by scanning/transmission electron microscopy. We show how properly chosen process parameters can lead to successful integration of single-walled nanotubes, enabling nano-electromechanical system synthesis.

  • 出版日期2007-2-21