Potential experimental error for determining CTE of stressed thin films

作者：Wang Z D^*; Jiang S Q

来源：Polymer Testing, 2007, 26(1): 116-121.

DOI：10.1016/j.polymertesting.2006.09.002

• thin film
• coefficient of thermal expansion
• pre-stress
• Young's modulus

The available testing techniques for the coefficient of thermal expansion (CTE) of materials can be divided into two types based on the state of the specimens during test: stress-free and pre-stressed. For traditional bulk specimens, there is no difference since the effect of the pre-stress is very small and can be neglected. However, for thin films, the pre-stress might cause an unacceptable experimental error if its effect is neglected. The related analysis is given in this study. In order to determine the CTE of thin films more accurately, a novel technique for stressed thin films was introduced and some test results for PI/SiO2 natiocomposite thin films were given.

• 出版日期2007-2
• 单位北京交通大学