摘要

The air- and encapsulation-induced degradations of poly(3-hexylthiophene) (P3HT) organic thin-film transistors (OTFTs) encapsulated with solution-processed polymer films were systematically analyzed to realize air-stable devices. By studying the potential degradation-inducing factors from air-O(2), moisture, N(2), and light, we determined that device degradations could be eliminated by isolating the devices from two of the factors: moisture and light. In terms of encapsulation-induced degradations, we examined 10 types of encapsulating polymers and found that such degradations could be avoided with polymers containing low-polarity function groups, including poly(vinyl methyl ketone), poly(methyl vinyl ether), poly(methyl methacrylate), and polystyrene. Based upon the identified sources of degradations, we demonstrated an encapsulation approach that involved (1) using a low-polarity encapsulating polymer layer to serve as a moisture barrier and to avoid encapsulation-induced degradation, and (2) applying a light-blocking agent. The resultant OTFTs showed no encapsulation-induced degradation while maintaining stable device characteristics for >5500 h of storage in the ambient air.

  • 出版日期2011-1