摘要
For determination of the energy-level alignment at interfaces between La0.7Sm0.3MnO3 films and two typical organic semiconductors, copper-phthalocyanine (CuPC) and alpha-sexithiophene (alpha-6T) we have performed a combined X-ray and ultraviolet photoemission study. La0.7Sr0.3MnO3 thin films were grown by using the pulsed laser deposition (PLD) technique and subsequently ex-situ cleaned before the organic materials were thermally evaporated. We show that under, these conditions the interfaces are free from chemical interaction and are characterized by a short-range interface dipole and large injection barriers.
- 出版日期2008-5