Scanning gate microscopy on a graphene nanoribbon

作者:Pascher Nikola*; Bischoff Dominik; Ihn Thomas; Ensslin Klaus
来源:Applied Physics Letters, 2012, 101(6): 063101.
DOI:10.1063/1.4742862

摘要

The metallic tip of a scanning probe microscope operated at a temperature of 1.7 K is used to locally induce a potential in a graphene nanoribbon. Images of the conductance through the device as a function of tip-position show that two centers of enhanced conductance are formed inside the structure. By applying a linescan-technique, it can be demonstrated that these two features correspond to two charge localizations, exhibiting the characteristics of quantum dots. Scanning gate microscopy allows us to characterize them with high resolution both in real space and as a function of energy.

  • 出版日期2012-8-6