A review of techniques for attaching micro- and nanoparticles to a probe';s tip for surface force and near-field optical measurements

作者：Gan Yang^*

来源：Review of Scientific Instruments, 2007, 78(8): 081101.

DOI：10.1063/1.2754076

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

• 出版日期2007-8