摘要

Active microwave imaging techniques are aimed at reconstructing an unknown region under test by means of suitable inversion algorithms starting from the measurement of the scattered electromagnetic field. Within such a framework, this paper focuses on an innovative strategy that fully exploits the information arising from the illumination of the investigation domain with different configurations as well as radiation patterns of the probing sources. The proposed approach can be easily integrated with multiview techniques and, unlike multifrequency methods, it does not require additive a-priori information on the dielectric nature of the scatterer under test. A large number of numerical simulations concerned with 2D geometries confirms the effectiveness of the inversion strategy as well as its robustness with respect to noise on data. Moreover, the results of a comparative study with single-source methodologies further point out the advantages and potentialities of the new approach.

  • 出版日期2010