A DEPFET based beam telescope with submicron precision capability

作者：Velthuis J J^*; Drasal Z; Hanninger G; Kohrs R; Mathes M; Reuen L; Scheirich D; Andricek L; Pascual I Carbonell; Chen X; Dolezal Z; Fischer P; Frey A; Fuster J A; Koch M; Kodys P; Kvasnicka P; Krueger H; Llacer C Lacasta; Lodomez P; Moser H G; Peric I; Raspereza A; Richter R; Rummel S; von Toerne E; Wermes N

来源：IEEE Transactions on Nuclear Science, 2008, 55(1): 662-666.

DOI：10.1109/TNS.2007.914031

• active pixel sensor
• DEPFET
• International Linear Collider (ILC)
• solid state detector
• vertex detector

For the detection of secondary vertices of long lived particles containing bottom and charm quarks at the International Linear Collider (ILC), a DEPFET pixel detector is one of the technologically favored options. In a DEPFET sensor a MOSFET pixel detector is integrated on a sidewards depleted silicon bulk sensor, thus combining the advantages of a fully depleted silicon sensor with in-pixel amplification. DEPFET pixel matrices have been characterized in a high energy particle beam. Since the DEPFET is a very high precision device, given its large S/N (> 100) and small pixel size (36 x 22 mu m(2)), a DEPFET based pixel telescope consisting of 5 DEPFETs has been developed. The uncertainty on the predicted position for a device under test (DUT) positioned inside the telescope was found to be 1.4 mu m with the existing device, due to the limited performance of two of the five DEPFET planes. A DEPFET telescope built of 5 modules equivalent to the best plane presented here, would have a track extrapolation error as low as 0.65 mu m at the DUT plane.

• 出版日期2008-2