摘要

We detect significant enhancements for single-layer and few-layer graphene on a new cutting cross section of 50-mu m thick silver strip at 785 nm. Besides the G and 2D bands are greatly enhanced, for few-layer graphene, the D' band (similar to 1620 cm(-1)) is split into four peaks and the results are concordant with the electron dispersion. This method is easy for operation and observation, and can provide more information about the D' band, has much potential to be applied in the studies of defect structure in graphene.

  • 出版日期2013-5-22

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