Ambiguous Role of Growth-Induced Defects on the Semiconductor-to-Metal Characteristics in Epitaxial VO2/TiO2 Thin Films

作者:Mihailescu Cristian N; Symeou Elli; Svoukis Efthymios; Negrea Raluca F; Ghica Corneliu; Teodorescu Valentin; Tanase Liviu C; Negrila Catalin; Giapintzakis John
来源:ACS Applied Materials & Interfaces, 2018, 10(16): 14132-14144.
DOI:10.1021/acsami.8b01436
  • 出版日期2018-4-25