摘要

Chromosome image analysis and pattern classification is one of the essential tasks in genetic syndrome diagnoses. An automatic procedure is introduced for chromosome image analysis. The pale-path algorithm is proposed to segment touching and overlapping chromosomes. Medial axis is extracted by the middle point algorithm. Chromosome band is enhanced by the algorithm based on multiscale wavelets Bi-spline, and extracted by average gray profile, gradient profile and shape profile. The multilayer classifier is used to classify the chromosome pattern calculated by weighted density distribution algorithm. Experiment results demonstrate that the algorithms perform well.