科研之友
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摘要
The understanding of the interplay between structural and electronic properties of photovoltaic materials as well as a deeper insight into growth pathways and phase formation kinetics of the absorber layer in a thin film solar cell give a crucial contribution to the continuous improvement of the solar cell efficiency. Among the various experimental methods used for the investigation of the structure and microstructure of photovoltaic materials, neutron, and X-ray (photon) scattering are key techniques of choice. Both techniques are complementary, which is demonstrated in the present paper. Neutron powder diffraction is used to detect different kinds of intrinsic point defects in chalcopyrite type and kesterite type semiconductors. The calculated defect concentrations may lead to the expectation of a clustering of anti-site defects ana vacancy to the electrical inactive defect pairs (2 V-Cu + In-Cu) and (In-Cu + Cu-In). By the means of energy dispersive X-ray diffraction (EDXRD) phase formations and grain growth in thin films are studied in real time. The potential of EDXRD for in situ studies cif reactions during the formation of chalcopyrite thin films is demonstrated.
- 出版日期2011-8
