An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

作者：Garampazzi Marco^*; Dal Toso Stefano; Liscidini Antonio; Manstretta Danilo; Mendez P; Romano L; Castello Rinaldo

来源：IEEE Journal of Solid-State Circuits, 2014, 49(3): 635-645.

DOI：10.1109/JSSC.2014.2301760

• Class-B
• class-C
• class-F
• CMOS integrated circuits
• excess noise factor (ENF)
• figure of merit (FoM)
• GSM
• impulse sensitivity function
• low-noise
• phase noise
• radio frequency integrated circuits
• voltage controlled oscillators
• wide tuning range oscillators

An intuitive yet sufficiently accurate formulation of the phase noise of various commonly used oscillators, including most types of class-B (standard, AC-coupled and with tail filter) and class-C, is derived and used to compare their fundamental limitations. A noise factor that represents the difference between the maximum achievable Figure of Merit and the actual one is derived for all topologies considered. Measurements on a dedicated chip prototype that integrates two high performance topologies allow to verify, in an unbiased way, the accuracy of the predictions. A very good agreement between the model and both simulation and measurement is obtained.

• 出版日期2014-3