Discarding wide baseline mismatches via topological clustering

作者:Wang Y T*; Zhang D Z; Tian J W
来源:Electronics Letters, 2008, 44(11): 670-U22.
DOI:10.1049/el:20083624

摘要

A novel scheme called topological clustering is presented to discard SIFT mismatches, based on the topological relationship consistence between two SIFT matches. The experimental results show that the developed method can extract high correct ratio matches efficiently from low correct ratio initial matches for wide baseline image pairs.