A new low-loss dielectric material ZnZrTa2O8 for microwave devices

作者：Lyu, Xiaosong; Li, Lingxia^*; Zhang, Shuai; Sun, Hao; Li, Sai; Ye, Jing; Zhang, Bowen; Li, Jiangteng

来源：Journal of the European Ceramic Society, 2016, 36(3): 931-935.

DOI：10.1016/j.jeurceramsoc.2015.11.015

• Ceramics
• Low loss
• Dielectric properties
• Tantalates

The first characterization of the microwave dielectric properties of ZnZrTa2O8 ceramic is presented. Single phase ZnZrTa2O8 ceramics with wolframite structure were prepared by a conventional mixed-oxide route and sintered in the temperature range of 1280-1360 degrees C. The microstructures and microwave dielectric properties were investigated systematically. The variation trend of Er was in accordance with that of relative density and molecular volume. The Q x f value was mainly depended on the atomic packing fraction. The tau(f) was found to be correlated with the variation of bond valence of the A- and B-site cations. The ZnZrTa2O8 ceramic sintered at 1320 degrees C for 6 h exhibited excellent microwave dielectric properties of epsilon(r) similar to 32, Q x f similar to 110,700 GHz, and tau(f) similar to -32 ppm/degrees rC. This constitutes a very promising material for microwave applications.

• 出版日期2016-2
• 单位天津大学