科研之友
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摘要
In this article, an attribute control chart has been proposed for the COM-Poisson distributed non-conformities using multiple dependent states sampling based on the exponentially weighted moving average statistic. Average run lengths of the out-of-control process with different shift levels of the COM-Poisson distribution have been calculated through simulation. From comparison, it has been observed that the proposed control chart is better in detecting the out-of-control process quickly as compared with the existing control chart. A simulated example has been given for the practical use of the proposed control chart.
- 出版日期2016-12
