A new approach for electron tomography: Annular dark-field transmission electron microscopy

作者:Bals S*; Van Tendeloo G; Kisielowski C
来源:Advanced Materials, 2006, 18(7): 892-+.
DOI:10.1002/adma.200502201

摘要

Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.

  • 出版日期2006-4-4