Microbeam grazing incidence small angle X-ray scattering - a new method to investigate heterogeneous thin films and multilayers

作者：Roth SV^*; Muller Buschbaum P; Burghammer M; Walter H; Panagiotou P; Diethert A; Riekel C

来源：Spectrochimica Acta Part B: Atomic Spectroscopy , 2004, 59(10-11): 1765-1773.

DOI：10.1016/j.sab.2004.07.024

• GISAXS
• microbeam
• self-assembly

The combination of the ID13/ESRF micrometer-sized X-ray beam with the reflection geometry allowed to establish a new scattering method for investigating laterally patterned heterogeneous multilayers and interfaces. This new method-called microbeam grazing incidence small angle X-ray scattering (muGISAXS)-has been applied to a novel gradient multilayer of self-assembled nanometer-sized noble metal clusters on top of a polymer layer, being of significant importance for many technological applications, including biorecognitive sensoring. The new feature of using a 5 mum X-ray beam allows to characterize laterally heterogeneous samples on two length scales, induced by the small beamsize and reciprocal space resolution. From the two-dimensional muGISAXS patterns the three-dimensional structure and morphology of the gradient of gold (An) clusters was reconstructed using detailed model simulations. Though being a highly complex sample, it turned out that the gradient is characterized by a single parameter, namely the cluster height. Atomic force microscopy (AFM) and optical absorption spectra provide supplementary information and help to enlighten the structure of evaporated gold clusters on polymer layers.

• 出版日期2004-10-8