Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport

作者:Li Ruipeng; Ward Jeremy W; Smilgies Detlef M; Payne Marcia M; Anthony John E; Jurchescu Oana D; Amassian Aram*
来源:Advanced Materials, 2012, 24(41): 5553-5558.
DOI:10.1002/adma.201201856

摘要

X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

  • 出版日期2012-11-2