A Method to Design SEC-DED-DAEC Codes With Optimized Decoding

作者：Reviriego Pedro^*; Martinez Jorge; Pontarelli Salvatore; Antonio Maestro Juan

来源：IEEE Transactions on Device and Materials Reliability, 2014, 14(3): 884-889.

DOI：10.1109/TDMR.2014.2332364

• SEC-DAEC codes
• Multiple Cell Upsets (MCUs)
• error correction codes
• SRAM memories

Single error correction-double error detection-double adjacent error correction (SEC-DED-DAEC) codes have been proposed to protect SRAM devices from multiple cell upsets (MCUs). The correction of double adjacent errors ensures that the most common types of MCUs are corrected. At the same time, SEC-DED-DAEC codes require the same number of parity check bits as traditional SEC-DED codes. The main overhead associated with SEC-DED-DAEC codes is the increase in decoding complexity that can impact access time and circuit power and area. In this paper, a method to design SEC-DED-DAEC codes with optimized decoding is presented and evaluated. The proposed scheme starts by setting some constraints on the parity check matrix of the codes. Those constraints are then used to simplify the decoding. The proposed scheme has been implemented and evaluated for different word-lengths. The results show that, for data words of 32 bits, the scheme can be implemented with the same number of parity check bits as SEC-DED codes. For 16 and 64 bits words, an additional parity check bit is required, making the scheme less attractive. With the proposed method, the decoders can be optimized for area or speed. Both implementations are evaluated and compared with existing SEC-DED-DAEC decoders. The results show that the proposed decoders reduce significantly the circuit area, power, and delay.

• 出版日期2014-9