Diffraction of gamma-rays with energies of 1.17 and 1.33MeV by a flat Si crystal

作者：Matsuba Shunya^*; Hayakawa Takehito; Shizuma Toshiyuki; Nishimori Nobuyuki; Nagai Ryoji; Sawamura Masaru; Angell Christopher T; Fujiwara Mamoru; Hajima Ryoichi

来源：Japanese Journal of Applied Physics, 2015, 54(5): 052203.

DOI：10.7567/JJAP.54.052203

Diffraction of gamma-rays by a flat Si crystal has been demonstrated using a high flux 60Co source with an intensity of 2.3 TBq. The diffraction intensities of the gamma-rays with energies of 1.17 and 1.33MeV have been measured as a function of the rotation angle of the crystal. Three peaks corresponding to the Si(440) and Si(220) diffractions for 1.17MeV and the Si(440) diffraction for 1.33MeV have been measured. The heights and shapes of these three peaks are well reproduced by taking into account Bragg's law and the experimental geometry.

• 出版日期2015-5