科研之友
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摘要
We have developed a novel microscope for visualizing electric fields in organic thin film devices on the basis of electric-field-induced second-harmonic generation (EFISHG) measurement. By using a radial polarized laser beam as a probing light, we showed that the electric field formed in metal-C-60-metal diodes in the film-thickness direction is visualized. The developed microscope has a potentiality in directly visualizing carrier motion in thin-film devices such as organic solar cells.
- 出版日期2013-4
