Diffraction Patterns of Aggregations of Edge Dislocations on Sectional X-Ray Topograms

作者：Novikov S M^*; Struk A Ya; Fodchuk I M

来源：Metallofizika i Noveishie Tekhnologii, 2010, 32(9): 1245-1257.

The features of diffraction patterns formation are studied for complexes of edge dislocations, which form microaggregations consisting of two, three and more dislocations, and also small-angle dislocation boundaries (walls). Various-intensity interference effects of rescattering and internal reflection of arising 'new' and already existent wave fields on the intensity distributions by thickness are revealed for the case of presence of edge dislocations with parallel and antiparallel Burgers vectors in the same slip plane.

• 出版日期2010-9